3DXRD at the Advanced Photon Source: Orientation Mapping and Deformation Studies
Authors: U Lienert; M C Brandes; J V Bernier; M J Mills; M P Miller; S F Li; C M Hefferan; J Lind; R M Suter; ARGONNE NATIONAL LAB IL
Abstract:
The high-energy diffraction microscopy program at the 1-ID beamline of the Advanced Photon Source is based on the 3DXRD diffraction technique. Essential developments include a near field forward modeling algorithm, far field high-resolution reciprocal space mapping continuous tensile deformation capability, and combination with post mortem electron microscopy. The beamline instrumentation is outlined and the status of the near and far field techniques is illustrated by selected case studies. The potential of the near field mapping technique to investigate orientation gradients in deformed metals is discussed and recent experimental results are presented on Ni and Al. The plastic deformation of a Ti-7Al alloy is investigated by a combination of far field diffraction and electron microscopy. Two material states of distinct dislocation microstructures are studied during continuous tensile deformation up to about 2% applied strain. Stress tensors of individual grains are evaluated and discussed in view to yield surface topology. The dislocation structures are investigated by high-resolution reciprocal space mapping and electron microscopy.
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