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mick

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mick

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Re: mick post# 130245

Thursday, 05/11/2006 10:30:25 PM

Thursday, May 11, 2006 10:30:25 PM

Post# of 635640
FEI Company: Japan Electronics manufacturer selects FEIC system for in-fab root cause analysis (FEIC) 24.20 -0.65 : Co announced that a global Japanese electronics manufacturer has selected FEI's DA 300 in-fab defect analyzer for its factory. The advanced automated system will enable critical root cause analysis in a fraction of the time required by other techniques and will be used for the first time ever to rapidly analyze process defects in C.C.D. semiconductor devices



Caspermick

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