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Elmer Phud

09/15/03 10:03 AM

#13211 RE: kpf #13204

kpf -

I do not see any unsurmountable obstacle to prevent AMD from testing HT-channels before bonding out. I have no idea if that can be done at wafer sort or requires an additional step (maybe even an additional tool) in a later stage of the backend process before bonding out.

You see no insurmountable obstacle yet you have no idea how it's done... Interesting...


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Golfbum

09/15/03 10:06 AM

#13212 RE: kpf #13204

so we have a wide highspeed datapath that is supposed to be "bonded out" over multiple pin possibilities?

you must be kidding!

gb