Remember this is a chart of product yield, not defect density
I don't think so. Intel's yield graphs have always been based on defect density and even so, the lack of a Y axis scale leaves it meaningless. An 82mm2 part yielding less in absolute numbers compared to a 130mm2 part, regardless of process generation would be disastrous under any conditions.
Edit: I see you have modified your wording so we are in agreement.