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Re: wbmw post# 3383

Thursday, 01/09/2003 8:05:46 PM

Thursday, January 09, 2003 8:05:46 PM

Post# of 151748
I would suspect a parametric problem.
WBMW--
We always characterized yield loss into two causes... defect related and parametric. Parametric yield loss was when some dimension was running tighter than the equipment was rated, which resulted in device failures. I suspect that in order to get the device performance AMD required, UMC pushed the process to the point of failure, resulting in poor yields.
--Alan

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