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Re: lmorovan post# 11517

Wednesday, 05/17/2006 3:45:00 PM

Wednesday, May 17, 2006 3:45:00 PM

Post# of 45771
...And what was that metrology device they allegedly purchased to measure wafer planarity? It was suppose to be a 100 times better than anything else. The Shartky-hartman device or something like that?

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