TECHNOLOGY LANDSCAPE FOR IN-PROCESS NDT FOR AM X-Ray detection is only identified with Arcam From the UK's Manufacturing Centre - Quality Control for AM Conference, 24-01-2017 - https://www.nottingham.ac.uk/research/groups/advanced-manufacturing-technology-research-group/documents/manufacturing-metrology-team/qcam-17/mtc-ben.pdf TECHNOLOGY LANDSCAPE FOR IN-PROCESS NDT FOR AM Dr Ben Dutton (MTC) Dr Mohd H. Rosli (MTC) Sarah Everton (MTC, University of Nottingham) http://investorshub.advfn.com/uimage/uploads/2017/7/28/sgvnjcurrent_in-situ_developments.jpg http://investorshub.advfn.com/uimage/uploads/2017/7/28/ywkbyIN-PROCESS_MONITORING_EXAMPLES_FOR_EBM.jpg http://investorshub.advfn.com/uimage/uploads/2017/7/28/vtfeoSUMARY_OF_CURRENT_IN-PROCESS_METHODS.jpg http://investorshub.advfn.com/uimage/uploads/2017/7/28/fcwmjEMERGING_METHODS_FOR_MICROSTRUCTURE_AND_SUBSURFACE_DISCONTINUITIES_DETECTION_POTENTIAL.jpg http://investorshub.advfn.com/uimage/uploads/2017/7/28/kzwocCAPABILITY_VS_INTEGRATION_DIFFICULTY.jpg