EVS’s iBar Receives US Patent Approval
CAESAREA, Israel, Sept. 08, 2016 (GLOBE NEWSWIRE) -- Elbit Vision Systems Ltd. (OTC:EVSNF), a pioneer in the science of camera-based automatic vision inspection for textile fabrics and technical webs, announced today that it has received a US patent approval (application 14/009,557) entitled On-Loom Fabric Inspection System and Method.
The patent covers the workings of EVS’s iBar product for on-loom inspection of woven fabrics in order to identify weaving faults during manufacture.
Mr. Sam Cohen, CEO of EVS, commented, “While protecting our intellectual property is certainly a priority, our goal for this patent has a much more strategic significance. For the first time, EVS will be able to quantify exactly what makes an imperfection a defect. By measuring the exact dimensions that turn a subjective flaw into an objective fault, we intend to eliminate the subjectivity of defects from textile manufacturing. By establishing measurable dimensions for defects, EVS can ensure the market has an accurate, reliable and repeatable way to create global quality standards. This will position the EVS standard as the benchmark for defect identification, against which all other systems will be measured.”
About Elbit Vision Systems Ltd. (EVS): www.evs.co.il
